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  A two-level approximate model driven framework for characterizing Multi-Cell Upsets impacts on processors
 
 
Title: A two-level approximate model driven framework for characterizing Multi-Cell Upsets impacts on processors
Author: Jiao, Jiajia
Marculescu, Diana
Juan, Da-Cheng
Fu, Yuzhuo
Appeared in: Microelectronics journal
Paging: Volume 48 () nr. C pages 7-17
Year: 2016
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 3 of 13 found articles
 
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