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                                       Details for article 8 of 8 found articles
 
 
  Quantization noise consideration and characterization in Sigma-Delta MEMS accelerometer
 
 
Title: Quantization noise consideration and characterization in Sigma-Delta MEMS accelerometer
Author: Liu, Yun-Tao
Wang, Ying
Shao, Lei
Appeared in: Microelectronics journal
Paging: Volume 47 () nr. C pages 53-60
Year: 2016
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 8 of 8 found articles
 
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