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Journal description
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Details for article 8 of 8 found articles
| Title: |
Quantization noise consideration and characterization in Sigma-Delta MEMS accelerometer |
| Author: |
Liu, Yun-Tao Wang, Ying Shao, Lei |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 47 () nr. C pages 53-60 |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 8 found articles
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