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  A Binary Decision Diagram based on-line testing of digital VLSI circuits for feedback bridging faults
 
 
Title: A Binary Decision Diagram based on-line testing of digital VLSI circuits for feedback bridging faults
Author: Biswal, Pradeep Kumar
Biswas, Santosh
Appeared in: Microelectronics journal
Paging: Volume 46 () nr. 7 pages 598-616
Year: 2015
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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