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Journal description
All volumes of the corresponding journal
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Details for article 10 of 14 found articles
| Title: |
Low V DD and body bias conditions for testing bridge defects in the presence of process variations |
| Author: |
Villacorta, Hector Garcia-Gervacio, Jose Segura, Jaume Champac, Victor |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 46 () nr. 5 pages 398-403 |
| Year: |
2015 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 14 found articles
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