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                                       Details for article 15 of 17 found articles
 
 
  Process corner detection by skew inverters for 500MHZ 2×VDD output buffer using 40-nm CMOS technology
 
 
Title: Process corner detection by skew inverters for 500MHZ 2×VDD output buffer using 40-nm CMOS technology
Author: Wang, Chua-Chin
Lu, Wen-Je
Juan, Kai-Wei
Lin, Wei
Tseng, Hsin-Yuan
Juan, Chun-Ying
Appeared in: Microelectronics journal
Paging: Volume 46 () nr. 1 pages 1-11
Year: 2015
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 15 of 17 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands