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                                       Details for article 20 of 34 found articles
 
 
  Compact modeling of response time and random-dopant-fluctuation-induced variability in nanoscale CMOS inverter
 
 
Title: Compact modeling of response time and random-dopant-fluctuation-induced variability in nanoscale CMOS inverter
Author: Lü, Wei-feng
Sun, Ling-Iing
Appeared in: Microelectronics journal
Paging: Volume 45 () nr. 6 pages 678-682
Year: 2014
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 20 of 34 found articles
 
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