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Journal description
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Details for article 17 of 34 found articles
| Title: |
A novel test optimizing algorithm for sequential fault diagnosis |
| Author: |
Yang, Chenglin Yan, Junhao Long, Bing Liu, Zhen |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 45 () nr. 6 pages 719-727 |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 17 of 34 found articles
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