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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
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Details for article 2 of 7 found articles
| Title: |
Assessment of structure variation in silicon nanowire FETs and impact on SRAM |
| Author: |
Liao, Yi-Bo Chiang, Meng-Hsueh Kim, Keunwoo Hsu, Wei-Chou |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 43 () nr. 5 pages 300-304 |
| Year: |
2012 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 7 found articles
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