|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 15 of 16 found articles
| Title: |
Timing yield analysis considering process-induced temperature and supply voltage variations |
| Author: |
Haghdad, Kian Anis, Mohab |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 43 () nr. 12 pages 956-961 |
| Year: |
2012 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 15 of 16 found articles
| << previous | next >> |