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Journal description
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Details for article 18 of 28 found articles
| Title: |
Impacts of gate-oxide breakdown on power-gated SRAM |
| Author: |
Yang, Hao-I Hwang, Wei Chuang, Ching-Te |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 42 () nr. 1 pages 101-112 |
| Year: |
2011 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 18 of 28 found articles
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