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Journal description
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Details for article 8 of 16 found articles
| Title: |
Defect detection of IC wafer based on two-dimension wavelet transform |
| Author: |
Liu, Hongxia Zhou, Wen Kuang, Qianwei Cao, Lei Gao, Bo |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 41 () nr. 2-3 pages 171-177 |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 16 found articles
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