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                                       Details for article 1 of 12 found articles
 
 
  A new fault current-sensing scheme for fast fault protection of the insulated gate bipolar transistor
 
 
Title: A new fault current-sensing scheme for fast fault protection of the insulated gate bipolar transistor
Author: Ji, In-Hwan
Ha, Min-Woo
Choi, Young-Hwan
Lee, Seung-Chul
Yun, Chong-Man
Han, Min-Koo
Appeared in: Microelectronics journal
Paging: Volume 39 () nr. 6 pages 908-913
Year: 2008
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 1 of 12 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands