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Journal description
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Details for article 13 of 81 found articles
| Title: |
A software technique to improve lifetime of caches containing ultra-leaky SRAM cells caused by within-die V th variation |
| Author: |
Goudarzi, Maziar Ishihara, Tohru Yasuura, Hiroto |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 39 () nr. 12 pages 1797-1808 |
| Year: |
2008 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 13 of 81 found articles
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