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Journal description
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Details for article 17 of 71 found articles
| Title: |
Electron inelastic mean free path for B4C and BC2N determined by reflection electron energy loss spectroscopy |
| Author: |
Castillo, H.A. Devia, A. Soto, G. Díaz, J.A. De La Cruz, W. |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 39 () nr. 11 pages 1382-1384 |
| Year: |
2008 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 17 of 71 found articles
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