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Journal description
All volumes of the corresponding journal
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Details for article 3 of 31 found articles
| Title: |
Analysis of slow traps centres in submicron MOSFETs by random telegraph signal technique |
| Author: |
Sghaier, N. Militaru, L. Trabelsi, M. Yacoubi, N. Souifi, A. |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 38 () nr. 4-5 pages 610-614 |
| Year: |
2007 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 31 found articles
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