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Journal description
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Details for article 6 of 15 found articles
| Title: |
In depth study of the compensation in annealed heavily carbon doped GaAs |
| Author: |
Rebey, A. Fathallah, W. El Jani, B. |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 37 () nr. 2 pages 158-166 |
| Year: |
2006 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 15 found articles
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