|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 7 of 15 found articles
| Title: |
How well can we assess thermally driven reliability issues in electronic systems today? Summary of panel held at the Therminic 2002 |
| Author: |
Joshi, Yogendra Azar, Kaveh Blackburn, David Lasance, Clemens J.M. Mahajan, Ravi Rantala, Jukka |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 34 () nr. 12 pages 1195-1201 |
| Year: |
2003 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 15 found articles
| << previous | next >> |