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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 9 of 15 found articles
| Title: |
Modeling and characterization of deep trench isolation structures |
| Author: |
Lee, S Bashir, R |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 32 () nr. 4 pages 295-300 |
| Year: |
2001 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 15 found articles
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