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                                       Details for article 3 of 14 found articles
 
 
  Application of I DDQ test in failure analysis of micro-controller devices
 
 
Title: Application of I DDQ test in failure analysis of micro-controller devices
Author: Wong, M.W.T.
Yu, A.M.F.
Li, C.K.
Appeared in: Microelectronics journal
Paging: Volume 32 () nr. 1 pages 29-34
Year: 2001
Contents:
Publisher: Elsevier Science Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 3 of 14 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands