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Journal description
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Details for article 15 of 17 found articles
| Title: |
The study on a screening threshold for reliability estimation of optoelectronic coupled devices |
| Author: |
Xu, J. Abbott, D. Dai, Y. |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 31 () nr. 7 pages 497-501 |
| Year: |
2000 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 15 of 17 found articles
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