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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 6 of 19 found articles
| Title: |
Electron trapping probabilities in hydrogen ion implanted silicon dioxide films thermally grown on polycrystalline silicon |
| Author: |
Gueorguiev, V.K Ivanov, Tz.E Dimitriadis, C.A Popova, L.I Andreev, S.K |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 31 () nr. 3 pages 207-211 |
| Year: |
2000 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 19 found articles
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