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Journal description
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Details for article 11 of 14 found articles
| Title: |
Residual strain mapping in III–V materials by spectrally resolved scanning photoluminescence |
| Author: |
Buchheit, M. Khoukh, A. Bejar, M. Krawczyk, S.K. Blanchet, R.C. |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 30 () nr. 7 pages 651-657 |
| Year: |
1999 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 14 found articles
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