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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 13 of 18 found articles
| Title: |
Extraction of the BSIM3 1/f noise parameters in CMOS transistors |
| Author: |
Vildeuil, J.C. Valenza, M. Rigaud, D. |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 30 () nr. 2 pages 199-205 |
| Year: |
1999 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 13 of 18 found articles
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