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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
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Details for article 9 of 11 found articles
| Title: |
Sheet resistance and layout effects in accelerated tests for dielectric reliability evaluation |
| Author: |
Pio, F. |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 27 () nr. 7 pages 675-685 |
| Year: |
1996 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 11 found articles
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