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Journal description
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Details for article 18 of 25 found articles
| Title: |
Piezoelectric field measurements by photoreflectance in strained InGaAs/GaAs structures grown on polar substrates |
| Author: |
Berger, P.D. Bru, C. Baltagi, Y. Benyattou, T. Berenguer, M. Guillot, G. Marcadet, X. Nagle, J. |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 26 () nr. 8 pages 827-833 |
| Year: |
1995 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 18 of 25 found articles
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