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                                       Details for article 14 of 18 found articles
 
 
  Measurement and modeling of drain current DLTS in enhancement SOI MOSFETs
 
 
Title: Measurement and modeling of drain current DLTS in enhancement SOI MOSFETs
Author: Haddara, H.
Elewa, M.T.
Cristoloveanu, S.
Appeared in: Microelectronics journal
Paging: Volume 24 () nr. 6 pages 647-657
Year: 1993
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 14 of 18 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands