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                                       Details for article 16 of 24 found articles
 
 
  Temperature, field and technological dependences of thin oxide breakdown characteristics
 
 
Title: Temperature, field and technological dependences of thin oxide breakdown characteristics
Author: Monsérié, C.
Mortini, P.
Pananakakis, G.
Ghibaudo, G.
Appeared in: Microelectronics journal
Paging: Volume 24 () nr. 4 pages 353-360
Year: 1993
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 16 of 24 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands