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Journal description
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Details for article 16 of 24 found articles
| Title: |
Temperature, field and technological dependences of thin oxide breakdown characteristics |
| Author: |
Monsérié, C. Mortini, P. Pananakakis, G. Ghibaudo, G. |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 24 () nr. 4 pages 353-360 |
| Year: |
1993 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 16 of 24 found articles
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