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Journal description
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Details for article 5 of 15 found articles
| Title: |
Combining boundary scan with I/O and other system functions to reduce system complexity |
| Author: |
Hobson, Richard F. |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 23 () nr. 3 pages 179-184 |
| Year: |
1992 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 15 found articles
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