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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 7 of 9 found articles
| Title: |
Investigation of gate oxide breakdown in CMOS integrated circuits |
| Author: |
Peŝić, B. Dimitrijev, S. Stojadinović, N. |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 20 () nr. 6 pages 19-26 |
| Year: |
1989 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 9 found articles
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