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                                       Details for article 2 of 37 found articles
 
 
  Accurate determination of doping profile from MOSFET d.c. measurement
 
 
Title: Accurate determination of doping profile from MOSFET d.c. measurement
Author: Gupta, S.
Appeared in: Microelectronics journal
Paging: Volume 19 () nr. 6 pages 4-7
Year: 1988
Contents:
Publisher: Elsevier Science Publishers Ltd.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 2 of 37 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands