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Journal description
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Details for article 21 of 48 found articles
| Title: |
Characterisation of InGaAs/GaAs superlattice structures by X-ray double crystal diffraction |
| Author: |
Shrivastava, M.C. Swaminathan, S. |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 19 () nr. 5 pages 29-33 |
| Year: |
1988 |
| Contents: | |
| Publisher: |
Elsevier Science Publishers Ltd., England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 21 of 48 found articles
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