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                                       Details for article 8 of 32 found articles
 
 
  A system for critical path analysis based on back annotation and distributed interconnect impedance models
 
 
Title: A system for critical path analysis based on back annotation and distributed interconnect impedance models
Author: Yacoub, G.Y.
Pham, H.
Ma, M.
Friedman, E.G.
Appeared in: Microelectronics journal
Paging: Volume 19 () nr. 3 pages 21-30
Year: 1988
Contents:
Publisher: BEP Data Services
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 8 of 32 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands