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                                       Details for article 3 of 30 found articles
 
 
  An easily testable optimal-time VLSI-multiplier B Becker (Univ. des Saarlandes, Saarbrucken, Germany)
 
 
Title: An easily testable optimal-time VLSI-multiplier B Becker (Univ. des Saarlandes, Saarbrucken, Germany)
Author:
Appeared in: Microelectronics journal
Paging: Volume 18 () nr. 6 pages 52
Year: 1987
Contents:
Publisher: Benn Electronics Publications Ltd.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 3 of 30 found articles
 
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