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                                       Details for article 18 of 20 found articles
 
 
  The reliability of encapsulated and unencapsulated thick-film hybrid microcircuits
 
 
Title: The reliability of encapsulated and unencapsulated thick-film hybrid microcircuits
Author: Sutherland, R.R.
Appeared in: Microelectronics journal
Paging: Volume 17 () nr. 4 pages 35-48
Year: 1986
Contents:
Publisher: Benn Electronics Publications Ltd.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 18 of 20 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands