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                                       Details for article 4 of 24 found articles
 
 
  A deep oxide trench SOI-LIGBT with self-driving PMOS for improved reliability
 
 
Title: A deep oxide trench SOI-LIGBT with self-driving PMOS for improved reliability
Author: Chen, Weizhong
Zeng, Xiangwei
He, Yuting
Wu, Ao
Appeared in: Microelectronics journal
Paging: Volume 157 () nr. C pages p.
Year: 2025
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 4 of 24 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands