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Journal description
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Details for article 3 of 56 found articles
| Title: |
A cross-scale investigation on transient electrothermal performance for power MOSFETs at device-package level |
| Author: |
Dai, Yuxuan Yao, Jiafei Chen, Jing Zhang, Maolin Xu, Yucheng Yao, Qing Qian, Qingyou Zhang, Jun Yang, Kemeng Guo, Yufeng |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 156 () nr. C pages p. |
| Year: |
2025 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 56 found articles
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