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                                       Details for article 25 of 40 found articles
 
 
  Design of radiation hardened latch with low delay and tolerance of quadruple-node-upset in 32 nm process
 
 
Title: Design of radiation hardened latch with low delay and tolerance of quadruple-node-upset in 32 nm process
Author: Huang, Zhengfeng
Chen, Xin
Jiang, Xinyu
Ai, Lei
Liang, Huaguo
Ouyang, Yiming
Ni, Tianming
Appeared in: Microelectronics journal
Paging: Volume 153 () nr. C pages p.
Year: 2024
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 25 of 40 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands