Digital Library
Close Browse articles from a journal
 
<< previous    next >>
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 2 of 40 found articles
 
 
  A cost-effective and highly robust triple-node-upset self-recoverable latch design based on dual-output C-elements
 
 
Title: A cost-effective and highly robust triple-node-upset self-recoverable latch design based on dual-output C-elements
Author: Xu, Hui
Tang, Lin
Ma, Ruijun
Liang, Huaguo
Huang, Zhengfeng
Ni, Tianming
Li, Jiuqi
Ai, Xiaodong
Appeared in: Microelectronics journal
Paging: Volume 153 () nr. C pages p.
Year: 2024
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 2 of 40 found articles
 
<< previous    next >>
 
 Koninklijke Bibliotheek - National Library of the Netherlands