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Journal description
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Details for article 25 of 27 found articles
| Title: |
Multiphysics simulation study of thermal stress effects in nanoscale FinFETs heterogeneously integrated with GaN high-power device on silicon substrate |
| Author: |
Duan, Huali Li, Erping Huang, Qinyi Xu, Yuehang Chen, Wenchao |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 150 () nr. C pages p. |
| Year: |
2024 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 25 of 27 found articles
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