|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 2 of 59 found articles
| Title: |
A new technique for the evaluation of the temperatures arising from some geometrics which commonly occur in microelectronics |
| Author: | |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 15 () nr. 3 pages 44 |
| Year: |
1984 |
| Contents: | |
| Publisher: |
Benn Electronics Publications Ltd, Luton |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 59 found articles
| << previous | next >> |