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Journal description
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Details for article 1 of 18 found articles
| Title: |
A behavioral model for electron irradiation effect on the DC performance in InP-based HEMT |
| Author: |
Meng, S.H. Han, X.L. Ding, P. Mei, B. Su, Y.B. Zhang, J.L. Yun, H.Q. Jin, Z. Zhong, Y.H. |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 148 () nr. C pages p. |
| Year: |
2024 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 18 found articles
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