|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 18 of 23 found articles
| Title: |
Intrinsic point defects investigation in InAlAs with extrapolated defect transition level |
| Author: |
Fang, Yuxin Zhang, Jialin Su, Yongbo Jin, Zhi Zhong, Yinghui |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 147 () nr. C pages p. |
| Year: |
2024 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 18 of 23 found articles
| << previous | next >> |