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Journal description
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Details for article 28 of 31 found articles
| Title: |
Reliability analysis and comparison of ring-PUF based on probabilistic models |
| Author: |
Bian, Jingchang Huang, Zhengfeng Lin, Yankun Yang, Zhao Liang, Huaguo Ni, Tianming |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 144 () nr. C pages p. |
| Year: |
2024 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 28 of 31 found articles
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