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                                       Details for article 24 of 32 found articles
 
 
  Hardened latch designs based on the characteristic of transistor for mitigating multiple-node-upsets in harsh radiation environments
 
 
Title: Hardened latch designs based on the characteristic of transistor for mitigating multiple-node-upsets in harsh radiation environments
Author: Xu, Hui
Liu, Chaoming
Ma, Ruijun
Song, Tai
Huang, Zhengfeng
Wang, Jun
Qin, Xuewei
Xia, Yu
Appeared in: Microelectronics journal
Paging: Volume 143 () nr. C pages p.
Year: 2024
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 24 of 32 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands