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                                       Details for article 21 of 32 found articles
 
 
  Examining the role of tap cell in suppressing single event transient effect in 28-nm CMOS technology
 
 
Title: Examining the role of tap cell in suppressing single event transient effect in 28-nm CMOS technology
Author: Zhang, Chenyu
Li, Yan
Zhan, Wenfa
Geng, Wenping
Liang, Ting
Zeng, Xiaoyang
Appeared in: Microelectronics journal
Paging: Volume 143 () nr. C pages p.
Year: 2024
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 21 of 32 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands