Digital Library
Close Browse articles from a journal
 
<< previous    next >>
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 22 of 23 found articles
 
 
  Total ionizing dose effect of bulk and SOI P-FinFET with linear workfunction modulation technology
 
 
Title: Total ionizing dose effect of bulk and SOI P-FinFET with linear workfunction modulation technology
Author: Ray, Abhishek
Naugarhiya, Alok
Mishra, Guru Prasad
Appeared in: Microelectronics journal
Paging: Volume 137 () nr. C pages p.
Year: 2023
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 22 of 23 found articles
 
<< previous    next >>
 
 Koninklijke Bibliotheek - National Library of the Netherlands