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Journal description
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Details for article 7 of 15 found articles
| Title: |
Bit-line leakage current tracking and self-compensation circuit for SRAM reliability design |
| Author: |
Dai, Chenghu Du, Yuanyuan Shi, Qi Wang, Ruixuan Zheng, Hao Lu, Wenjuan Peng, Chunyu Hao, Licai Lin, Zhiting Wu, Xiulong |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 132 () nr. C pages p. |
| Year: |
2023 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 15 found articles
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