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Journal description
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Details for article 20 of 34 found articles
| Title: |
Comparison in radiation tolerance between FLR planar junction termination and positive bevel edge termination for power diodes |
| Author: |
Liao, Xinfang Liu, Yi Xu, Changqing Wang, Chen Yang, Yintang |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 128 () nr. C pages p. |
| Year: |
2022 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 20 of 34 found articles
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