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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 8 of 8 found articles
| Title: |
Test power and area optimized logic built-in self-test with higher fault coverage for automobile SoCs |
| Author: |
Shivakumar, Vishnupriya Senthilpari, C. Yusoff, Zubaida |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 124 () nr. C pages p. |
| Year: |
2022 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 8 found articles
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