|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 21 of 29 found articles
| Title: |
Investigation on negative capacitance FinEFT beyond 7 nm node from device to circuit |
| Author: |
Huo, Jiali Huang, Weixing Zhang, Fan Zhang, Shengli Gan, Weizhuo Huo, Qiang Cai, Yuwei Zhang, Qingzhu Li, Yongliang Zhu, Huilong Yin, Huaxiang Wu, Zhenhua |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 116 () nr. C pages p. |
| Year: |
2021 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 21 of 29 found articles
| << previous | next >> |